CT defect analysis with artificial intelligence - Ingeniørens Innkjøpsbok

CT defect analysis with artificial intelligence

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Reliable evaluation software for inline and atline X-ray inspection

 

ZEISS Automated Defect Detection (ZADD) software allows even the smallest defects in components to be detected reliably, quickly and automatically, so that even small and fuzzy defects to be evaluated.  In doing so, the Automated Defect Detection (ADD) software, also called Automated Defect Recognition (ADR) software, can be used not only for injection molded parts, but also for batteries and printed components (MED/AM).

 

ZEISS offers everything from a single source: with the complete ZEISS X-ray portfolio, you can use artificial intelligence (AI) in 3D computed tomography (CT) and 2D X-ray technology both inline and atline. ZEISS Automated Defect Detection software is compatible with all ZEISS computed tomography systems.

 

Your advantages with the ZEISS Automated Defect Detection software at a glance:

 

Defect analysis in only 60 seconds in inline mode

  • Minimization of test cycle times
  • Faster scans/defect detection
  • Time saving for operators

 

Robust quality results & clear reporting

  • Perfect results, even if image quality is not perfect
  • Suitable for mixed and dense materials

 

No parameter tuning required

  • Subjective decisions are avoided
  • No reference data required in atline mode

 

User-defined ZEISS Automated Defect Detection software

  • Custom optimization of defect analysis
  • User-defined programming of the software

 

Download information here:

https://www.zeiss.dk/metrology/products/software/zadd.html?mkt_tok=ODk2LVhNUy03OTQAAAGIhP52Fsf1bjIAUmiswLz9dwRL4iCqsx7y4LfOt5TQ-cXtsfnMu_qTJLBn-qSWJS_6scC-wfo9HAVTZGdr_CExG2sr4E13kfmssiRw6bzE5goNhkTQLGA#download